Fourier Analysis-based Automatic Test Pattern Generation for Combinational Circuits
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Date
2015
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Ieee
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Abstract
Fourier analysis of boolean functions has attracted great attention from computer scientists in the last decade but it still has few application areas. This work presents a Fourier analysis-based automatic test pattern generation method for combinational circuits.
Description
Ayav, Tolga/0000-0003-1426-5694
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Keywords
Combinational circuit, Fourier analysis, Walsh transformation, automatic test pattern generation
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23nd Signal Processing and Communications Applications Conference (SIU) -- MAY 16-19, 2015 -- Inonu Univ, Malatya, TURKEY