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Neden-Sonuç Çizgelerinden Test Girilerinin Oluturulmas

dc.author.scopusid 57192070398.0
dc.author.scopusid 13408184500.0
dc.author.scopusid 57200611344.0
dc.contributor.author Kavzak, D.
dc.contributor.author Ayav, T.
dc.contributor.author Belli, F.
dc.contributor.author Ayav, Tolga
dc.contributor.other Bilgisayar Mühendisliği Bölümü
dc.date.accessioned 2023-10-30T08:17:49Z
dc.date.available 2023-10-30T08:17:49Z
dc.date.issued 2016
dc.department Izmir Institute of Technology İYTE en_US
dc.department-temp Kavzak, D., Izmir Yüksek Teknoloji Enstitüsü Bilgisayar Mühendislii BölümÜ, Urla,Izmir, 35430, Turkey, Yazilim Mühendislii Bölümü, Yaşar ÜNiversitesi, Bornova,Izmir, 35100, Turkey; Ayav, T., Izmir Yüksek Teknoloji Enstitüsü Bilgisayar Mühendislii BölümÜ, Urla,Izmir, 35430, Turkey; Belli, F., Izmir Yüksek Teknoloji Enstitüsü Bilgisayar Mühendislii BölümÜ, Urla,Izmir, 35430, Turkey en_US
dc.description.abstract Cause-effect graphing is a well-known requirement based testing technique. However, since it was introduced by Myers in 1979, there seems not to have been any suffciently comprehensive studies to generate test cases from these graphs. This paper proposes to convert cause-effect graphs into Boolean expressions and find out the test cases using test input generation techniques for Boolean expressions, such as MI, MAX-A and CUTPNFP. Mutation analysis is used to compare the fault detection capabilities of these techniques and the results are also compared to the Myers' original test generation technique. en_US
dc.identifier.doi [SCOPUS-DOI-BELIRLENECEK-2]
dc.identifier.endpage 153 en_US
dc.identifier.issn 1613-0073
dc.identifier.scopus 2-s2.0-84996593750
dc.identifier.startpage 142 en_US
dc.identifier.uri http://65.108.157.135:4000/handle/123456789/123
dc.identifier.volume 1721 en_US
dc.language.iso tr en_US
dc.opencitations.citationcount 0
dc.publisher CEUR-WS en_US
dc.relation.ispartof CEUR Workshop Proceedings -- 10th Turkish National Software Engineering Symposium, UYMS 2016 -- 24 October 2016 through 26 October 2016 -- 124653 en_US
dc.relation.publicationcategory Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı en_US
dc.rights info:eu-repo/semantics/closedAccess en_US
dc.scopus.citedbyCount 0
dc.sobiad.citationcount 0
dc.subject Cause-effect graph en_US
dc.subject Model-based testing en_US
dc.subject Mutation test analysis en_US
dc.subject Software testing en_US
dc.title Neden-Sonuç Çizgelerinden Test Girilerinin Oluturulmas en_US
dc.type Conference Object en_US
dspace.entity.type Publication
relation.isAuthorOfPublication c6b1de69-69eb-4c14-9a6d-ed9755d501f4
relation.isAuthorOfPublication.latestForDiscovery c6b1de69-69eb-4c14-9a6d-ed9755d501f4
relation.isOrgUnitOfPublication c6842224-7566-492d-b2b4-2d51b18ef9e3
relation.isOrgUnitOfPublication.latestForDiscovery c6842224-7566-492d-b2b4-2d51b18ef9e3

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