Ayav, TolgaAyav, TolgaBilgisayar Mühendisliği Bölümü2023-10-302023-10-302015097814673738692165-0608[WOS-DOI-BELIRLENECEK-2]http://65.108.157.135:4000/handle/123456789/94Ayav, Tolga/0000-0003-1426-5694Fourier analysis of boolean functions has attracted great attention from computer scientists in the last decade but it still has few application areas. This work presents a Fourier analysis-based automatic test pattern generation method for combinational circuits.trinfo:eu-repo/semantics/closedAccessCombinational circuitFourier analysisWalsh transformationautomatic test pattern generationConference Object