WOS
Permanent URI for this collectionhttp://65.108.157.135:4000/handle/123456789/9
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Browsing WOS by Language "tr"
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Conference Object Citation - WoS: 0Automatic Code Generation with Document Responsibility Collaboration Modelling Method(Ieee, 2020) Tuglular, Tugkan; Leblebici, Onur; Tuğlular, Tuğkan; Bilgisayar Mühendisliği BölümüUML is highly preferred for design in current software development approaches. However, the conceptual gap between entities in business processes and classes in UML designs is not small. To reduce this gap, this paper proposes using documents that are vital to every business. The proposed new method called Document Responsibility Collaboration puts the concept of documents at the center. In the proposed method, documents are meta-models of classes in terms of programming, and at the same time, they are meta-models of relationships in terms of permanence. The proposed Document Responsibility Collaboration method uses the domain concept in which domains are made up of documents, and a document defined in a domain can work with another document in any domain to fulfill its responsibility. Document Responsibility Collaboration method defines a process, which starts at the transition from analysis to design phase and continues to the code generation phase. An example from the order management domain is provided to validate the recommended method.Conference Object Citation - WoS: 0Container Damage Detection and Classification Using Container Images(Ieee, 2020) Imamoglu, Zeynep Ekici; Tuglular, Tugkan; Bastanlar, Yalin; Tuğlular, Tuğkan; Bilgisayar Mühendisliği BölümüIn the logistics sector, digital transformation is of great importance in terms of competition. In the present case, container warehouse entry / exit operations are carried out manually by the logistics personnel including container damage detection. During container warehouse entry / exit process, the process of detecting damaged containers is carried out by the personnel and several minutes are required to upload to the IT system. The aim of our work is to automate the detection of damaged containers. This way, the mistakes made by the personnel will be eliminated and the process will be accelerated. In this work, we propose to use a convolutional neural network (CNN) that takes the container images and classify them as damaged or undamaged. We modeled the problem as a binary classification and employed different CNN models. The result we obtained shows that there is no single best method for the classification. It is shown how the dataset was created and how the parameters used in the layered structures affect the models employed in this study.Conference Object Citation - WoS: 0Evaluation of Scheduling Architectures for OSEK/VDX Compliant Hard Real-Time Operating Systems(Ieee, 2020) Saydam, Berkay; Ayav, Tolga; Ayav, Tolga; Bilgisayar Mühendisliği BölümüDeveloping technology is reflected to the vehicles as well. But it brings the challenge of adding new functionalities to vehicles without compromising safety. The chips, which are used to provide the functionalities, are determined in the first step of ECU design. This decision will effect the remaining part of the development. Designing hardware and software together with testing phase is a long process in automotive industry. Changing the design of the hardware is quite costly after an ECU begins to be used in field. For these reasons, the selection of chips is directly related to cost and the functionality which should be provided to customer. Tasks, which fulfill desired functionality, provide a balance between performance and safety. These were evaluated for an OSEK/VDX certified OS and results are presented from the scheduling algorithms point of view.Conference Object Citation - WoS: 0Fourier Analysis-based Automatic Test Pattern Generation for Combinational Circuits(Ieee, 2015) Ayav, Tolga; Ayav, Tolga; Bilgisayar Mühendisliği BölümüFourier analysis of boolean functions has attracted great attention from computer scientists in the last decade but it still has few application areas. This work presents a Fourier analysis-based automatic test pattern generation method for combinational circuits.