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Towards test case generation for synthesizable VHDL programs using model checker

dc.author.scopusid13408184500.0
dc.author.scopusid14627984700.0
dc.author.scopusid57200611344.0
dc.contributor.authorAyav, T.
dc.contributor.authorTuglular, T.
dc.contributor.authorBelli, F.
dc.contributor.authorTuğlular, Tuğkan
dc.contributor.authorAyav, Tolga
dc.contributor.otherBilgisayar Mühendisliği Bölümü
dc.date.accessioned2023-10-30T08:07:03Z
dc.date.available2023-10-30T08:07:03Z
dc.date.issued2010
dc.departmentIzmir Institute of Technology İYTEen_US
dc.department-tempAyav, T., Dept. of Computer Engineering, Izmir Institute of Technology, Turkey; Tuglular, T., Dept. of Computer Engineering, Izmir Institute of Technology, Turkey; Belli, F., Dept. of Computer Science, Electrical Engineering and Mathematics, University of Paderborn, Germanyen_US
dc.descriptionNational University of Singapore (NUS);Infocomm Development Authority of Singapore;Reliability Societyen_US
dc.description.abstractVHDL programs are often tested by means of simulations, relying on test benches written intuitively. In this paper, we propose a formal approach to construct test benches from system specification. To consider the real-time properties of VHDL programs, we first transform them to timed automata and then perform model checking against the properties designated from the specification. Counterexamples returned from the model checker serve as a basis of test cases, i.e., they are used to form a test bench. The approach is demonstrated and complemented by a simple case study. © 2010 IEEE.en_US
dc.identifier.citation2
dc.identifier.doi10.1109/SSIRI-C.2010.22
dc.identifier.endpage53en_US
dc.identifier.isbn9780769540870
dc.identifier.scopus2-s2.0-77956097952
dc.identifier.startpage46en_US
dc.identifier.urihttps://doi.org/10.1109/SSIRI-C.2010.22
dc.identifier.urihttp://65.108.157.135:4000/handle/123456789/61
dc.language.isoenen_US
dc.opencitations.citationcount2
dc.plumx.crossrefcitations2
dc.plumx.mendeleyreaders13
dc.plumx.scopuscitations2
dc.relation.ispartofSSIRI-C 2010 - 4th IEEE International Conference on Secure Software Integration and Reliability Improvement Companion -- 4th IEEE International Conference on Secure Software Integration and Reliability Improvement Companion, SSIRI-C 2010 -- 9 June 2010 through 11 June 2010 -- Singapore -- 81517en_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.scopus.citedbyCount2
dc.sobiad.citationcount0
dc.subjectModel checkingen_US
dc.subjectProgram transformationen_US
dc.subjectSynthesizable VHDLen_US
dc.subjectTest case generationen_US
dc.subjectTimed automataen_US
dc.titleTowards test case generation for synthesizable VHDL programs using model checkeren_US
dc.typeConference Objecten_US
dspace.entity.typePublication
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relation.isAuthorOfPublicationc6b1de69-69eb-4c14-9a6d-ed9755d501f4
relation.isAuthorOfPublication.latestForDiscovery16066bf2-f189-4d4b-91e8-3fc6cb495163
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relation.isOrgUnitOfPublication.latestForDiscoveryc6842224-7566-492d-b2b4-2d51b18ef9e3

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